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DETECTION/DISCRIMINATION APPARATUS, FOREIGN MATTER DISCRIMINATION METHOD, AND MANUFACTURING METHOD OF SUBSTRATE FOR MASK

机译:面膜基质的检测/鉴别装置,外来物质鉴别方法和制造方法

摘要

PROBLEM TO BE SOLVED: To provide a detection/discrimination apparatus, capable of rapidly detecting the foreign matters of a substrate and discriminating the types of the foreign matters, using a simple configuration.;SOLUTION: The detection/discrimination apparatus detects foreign matters in the substrate 50 and discriminates the types of foreign matters. The detection/discrimination apparatus comprises detection systems 1, 2, 41 that obtain the position information and image information of foreign matters, by detecting the foreign matters of the substrate; irradiation systems 31, 32, 33, 41 for irradiation of laser beams to the foreign matters detected by the detection system; and discrimination sections 41, 42 for discriminating the types of foreign matters, based on the image information of the regions of foreign matters, before applying laser beams obtained in the detection system and image information of the corresponding regions, after the irradiation of laser beams.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供一种检测/辨别装置,其能够使用简单的构造来快速检测基板的异物并辨别异物的类型;解决方案:该检测/辨别装置检测容器中的异物。基材50并区分异物的类型。该检测/鉴别装置包括检测系统1、2、41,该检测系统1、2、41通过检测基板的异物而获得异物的位置信息和图像信息。照射系统31、32、33、41,用于将激光束照射到由检测系统检测出的异物。辨别部41、42在照射激光束之后,基于异物区域的图像信息,在施加在检测系统中获得的激光束和相应区域的图像信息之前,辨别异物的类型。 ;版权:(C)2009,日本特许厅&INPIT

著录项

  • 公开/公告号JP2009097891A

    专利类型

  • 公开/公告日2009-05-07

    原文格式PDF

  • 申请/专利权人 NIKON CORP;

    申请/专利号JP20070267307

  • 发明设计人 OTAKI TATSURO;

    申请日2007-10-15

  • 分类号G01N21/88;

  • 国家 JP

  • 入库时间 2022-08-21 19:39:53

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