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Equivalent Characteristic verification manner and equivalent Characteristic verification device null

机译:等效特征验证方式及等效特征验证装置

摘要

PROBLEM TO BE SOLVED: To provide a method for verifying equivalence of a circuit description language capable of easy verification.;SOLUTION: The method for verifying equivalence of the circuit description is provided with: a step for performing circuit synthesis to first design data related to a semiconductor integrated circuit described in a first circuit description language to obtain second design data 14 described in a second circuit description language lower in the degree of extraction than the first circuit description language; and a step for comparing third design data 20 described in the second circuit description language with the second design data 14 to verify a correspondence between the two and performing formal verification to a part which does not correspond. When all the second and the third design data 14 and 20 correspond and both are equal as a result of the formal verification with respect to the non-correspondent part, the first design data 10 are determined to be equivalent to the third design data 20.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供一种能够容易验证的,用于验证电路描述语言的等效性的方法;解决方案:用于验证电路描述的等效性的方法包括:对与第一设计数据相关的第一电路进行电路综合的步骤以第一电路描述语言描述的半导体集成电路,以第二电路描述语言描述的第二设计数据14,其提取程度低于第一电路描述语言;用于比较以第二电路描述语言描述的第三设计数据20与第二设计数据14以验证两者之间的对应关系并对不对应的部分进行形式验证的步骤。当相对于非对应部分进行形式验证时,当所有第二设计数据14和第三设计数据20全部对应且均相等时,确定第一设计数据10与第三设计数据20相等。 ;版权:(C)2007,日本特许厅和INPIT

著录项

  • 公开/公告号JP4268620B2

    专利类型

  • 公开/公告日2009-05-27

    原文格式PDF

  • 申请/专利号JP20060053918

  • 发明设计人 藤田 昌宏;

    申请日2006-02-28

  • 分类号G06F17/50;

  • 国家 JP

  • 入库时间 2022-08-21 19:38:44

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