首页> 外国专利> Oblique incidence interferometer fringe pattern discriminator

Oblique incidence interferometer fringe pattern discriminator

机译:斜入射干涉仪条纹图案鉴别器

摘要

In order to discriminate the interference pattern to which information of each type includes the information of even characteristic and the thickness fluctuation optical permeable plane surface parallel test flatly regarding and, is superimposed, it seeks with the oblique incidence interferometer which is altered. It can change the skimming over angle of the interferometer, unique modulation frequency of local interference fringes strength inside the interference pattern which is superimposed is identified. The local interference fringes strength which originates in the interference pattern which differs is identified by the respective modulation frequency.
机译:为了辨别包括均匀特性的信息和厚度变动光透过性平面平行测试的各种类型的信息并叠加在一起的干涉图案,以改变后的倾斜入射干涉仪来寻找。它可以改变干涉仪的撇除角度,识别叠加在干涉图样内部的局部干涉条纹强度的唯一调制频率。由不同的干涉图案产生的局部干涉条纹强度通过相应的调制频率来识别。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号