Taking in the response output signal of IC test equipment null suffering test IC which uses the response output signal

摘要

PROBLEM TO BE SOLVED: To speed up an IC testing device. ;SOLUTION: In this IC testing device for judging the quality of an IC to be tested by comparing the compared result with an expected value by reading the compared result in a logic comparator in the impressing timing of a strobe pulse by comparing and judging whether or not to have voltage corresponding to normal H logic and L logic in a comparator by inputting a response output signal outputted by the IC to be tested to the comparator via a signal transmission line, an expected value signal is superimposed on the response output signal in the timing when the response output signal arrives at the comparator, and the rise of the response output signal is steepened to quicken the detecting timing of the comparator.;COPYRIGHT: (C)2001,JPO