首页> 外国专利> Tomographic wavefront analysis system and method for mapping the optical system

Tomographic wavefront analysis system and method for mapping the optical system

机译:层析X射线波前分析系统和光学系统测绘方法

摘要

A tomographic wavefront analysis system (900) comprises a system (910) adapted to produce a light beam and a fixation target system (940) adapted to focus the eye in a plurality of different directions. The analysis system further comprises an optical system (920) adapted to provide the light beam sequentially onto a plurality of different locations on a retina of the eye, the locations corresponding to the different directions in which the eye is focused by the fixation target system (940) and a wavefront sensor (930) adapted to receive scattered light from each of the different locations.
机译:断层摄影波前分析系统(900)包括适于产生光束的系统(910)和适于将眼睛聚焦在多个不同方向上的注视目标系统(940)。该分析系统还包括光学系统(920),该光学系统适于将光束顺序地提供到眼睛的视网膜上的多个不同位置上,该位置对应于固定目标系统将眼睛聚焦在其中的不同方向( 940)和波前传感器(930),波前传感器(930)适于接收来自每个不同位置的散射光。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号