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HIGH SPEED SERIAL TRACE PROTOCOL FOR DEVICE DEBUG

机译:用于设备调试的高速串行跟踪协议

摘要

Tracing of test information from a hardware device for debugging is formatted for transmission via a high-speed serial protocol. Data from various components in the hardware device is transmitted to an external test board using high speed serial ports. The number of serial ports needed for data transfer is significantly less than a complimentary parallel port configuration. Additional functional blocks on the chip process the data for high speed serial output. The functional blocks format information into subchannels, arbitrate data, append protocol, perform data integrity checks, and serialize the data. The additional blocks built on the chip to support the serial ports consume less chip space than the space consumed by the number of parallel ports required to provide equivalent data transfer rates. The process operates in near real time and may use time stamping to correlate and reconstruct data from different information sources. An input port receives data from the external test component to modify registers or memory, set break points, modify hardware status, communicate with processors, or modify other operating conditions to debug the hardware device.
机译:格式化来自硬件设备的测试信息以进行调试,以便通过高速串行协议进行传输。使用高速串行端口将来自硬件设备中各个组件的数据传输到外部测试板。数据传输所需的串行端口数量明显少于互补的并行端口配置。芯片上的其他功能块处理数据以实现高速串行输出。功能块将信息格式化为子通道,仲裁数据,附加协议,执行数据完整性检查以及对数据进行序列化。芯片上支持串行端口的其他模块所消耗的芯片空间要少于提供等效数据传输速率所需的并行端口数量所消耗的空间。该过程几乎实时地运行,并且可以使用时间戳来关联和重构来自不同信息源的数据。输入端口从外部测试组件接收数据,以修改寄存器或存储器,设置断点,修改硬件状态,与处理器通信或修改其他操作条件以调试硬件设备。

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