首页> 外国专利> METHOD OF USING SNR TO REDUCE FACTORY TEST TIME

METHOD OF USING SNR TO REDUCE FACTORY TEST TIME

机译:利用信噪比减少出厂测试时间的方法

摘要

The application relates to wireless networks and more particularly to a method of reducing factory test time of receiver sensitivity in a Code Division Multiple Access (CDMA) wireless device. Under TIA/EIA/-98E, the radio frequency (RF) sensitivity of a CDMA wireless receiver is the minimum received power, measured at the mobile station antenna connector, at which the frame error rate (FER) does not exceed 0.5% with 95% confidence. In order to reduce the test time of FER test method, the relation between correlated energy (or Ec/Io) and FER is determined using simulated traffic and the correlated energy (or Ec/Io) measurement is then used as the test parameter on like models to achieve the same or superior test confidence with significantly reduced test time.
机译:本申请涉及无线网络,并且更具体地涉及一种减少码分多址(CDMA)无线设备中的接收机灵敏度的工厂测试时间的方法。在TIA / EIA / -98E下,CDMA无线接收器的射频(RF)灵敏度是在移动站天线连接器处测得的最小接收功率,在这种情况下,帧错误率(FER)不超过0.5%(95) % 置信度。为了减少FER测试方法的测试时间,使用模拟流量来确定相关能量(或Ec / Io)与FER之间的关系,然后将相关能量(或Ec / Io)测量结果用作类似的测试参数这些模型可实现相同或更高的测试置信度,并显着减少测试时间。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号