首页> 外国专利> Test writing method and information recording device

Test writing method and information recording device

机译:试题编写方法及信息记录装置

摘要

The object of the present invention is to provide a test writing method for seeking the optimum write power correctly and in a short time under a high speed recording condition in a test writing method and an information recording device for recording information by forming different marks from the unrecorded part by injecting energy onto the recording medium. To achieve the above object, even number length marks and odd number length marks are separately test written in the 2T strategy to seek the respective optimum write power. Due to the possibility of enhancing the precision of test writing, a good recording ability can be obtained.
机译:本发明的目的是提供一种测试写入方法,该测试写入方法用于在测试记录方法中的高速记录条件下在短时间内正确地寻找最佳写入功率;以及一种信息记录装置,用于通过与记录介质形成不同的标记来记录信息。通过将能量注入到记录介质上来获得未记录的部分。为了达到上述目的,在2T策略中分别测试偶数长度标记和奇数长度标记以寻求各自的最佳写入功率。由于可以提高测试书写的精度,因此可以获得良好的记录能力。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号