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METHOD AND APPARATUS FOR SUB-HARMONIC CONTRAST IMAGING

机译:次谐波造影的方法和装置

摘要

A non-linear response may be measured by transmitting a first pulse at an amplitude and transmit frequency, using an aperture having N elements. A first response is measured at a sub-harmonic frequency based on the transmit frequency. At least second and third pulses are transmit at the amplitude and transmit frequency. At least second and third responses are measured at the sub-harmonic frequency. The second and third pulses have the same phase with respect to each other and use first and second sub-apertures that have different ones of the N elements. A sum of the elements within the first and second sub-apertures is equal to N. Alternatively, at least two pulses having the same aperture and different amplitudes may be transmit, and the responses measured at the sub-harmonic frequency. The responses are combined to suppress linear echoes and determine a non-linear response.
机译:非线性响应可以通过使用具有N个元素的光圈以一定幅度和频率发射第一脉冲来测量。基于发射频率,在次谐波频率上测量第一响应。至少第二和第三脉冲以振幅和发射频率发射。在次谐波频率上测量至少第二和第三响应。第二和第三脉冲彼此具有相同的相位,并且使用具有N个元件中的一个不同的第一和第二子孔径。第一和第二子孔径内的元素之和等于N。或者,可以发射具有相同孔径和不同幅度的至少两个脉冲,并且以子谐波频率测量响应。组合响应以抑制线性回波并确定非线性响应。

著录项

  • 公开/公告号US2009227872A1

    专利类型

  • 公开/公告日2009-09-10

    原文格式PDF

  • 申请/专利权人 LIHONG PAN;FENG LIN;

    申请/专利号US20080045434

  • 发明设计人 FENG LIN;LIHONG PAN;

    申请日2008-03-10

  • 分类号A61B8/00;

  • 国家 US

  • 入库时间 2022-08-21 19:34:02

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