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Optical Multiwavelength Window Contamination Monitor for Optical Control Sensors and Systems

机译:用于光学控制传感器和系统的光学多波长窗口污染监测仪

摘要

A foreign-particle detection system for use with an optical instrument having a transmissive window with a first side and a second side includes a radiation source to emit a radiation signal, a diffusing reflector to diffusively spread the radiation signal emitted by the radiation source over the first side of the transmissive window, a radiation detector to detect, at the second side of the transmissive window, the diffusively spread radiation signal transmitted by the transmissive window, and to generate a detected radiation signal based on the detected diffusively spread radiation signal, and a computation module communicatively coupled to the radiation detector to detect a presence of foreign particles on at least one of the first side or the second side of the transmissive window based on at least the detected radiation signal.
机译:与具有透射窗的光学仪器一起使用的异物检测系统,该透射窗具有第一侧和第二侧,该透射窗具有发射辐射信号的辐射源,扩散反射器以将由辐射源发射的辐射信号扩散地扩散到辐射窗上。透射窗的第一侧,是辐射检测器,其在透射窗的第二侧检测由透射窗发射的扩散扩散的辐射信号,并基于检测到的扩散扩散的辐射信号来生成检测到的辐射信号,以及计算模块通信地耦合到辐射检测器,以至少基于所检测到的辐射信号来检测在透射窗的第一侧或第二侧中的至少一个上的异物的存在。

著录项

  • 公开/公告号US2009015824A1

    专利类型

  • 公开/公告日2009-01-15

    原文格式PDF

  • 申请/专利权人 GARY SHUBINSKY;SAM PARIS;

    申请/专利号US20080170308

  • 发明设计人 GARY SHUBINSKY;SAM PARIS;

    申请日2008-07-09

  • 分类号G01N21/00;

  • 国家 US

  • 入库时间 2022-08-21 19:33:38

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