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QUANTITATIVE DIFFERENTIAL INTERFERENCE CONTRAST (DIC) MICROSCOPY AND PHOTOGRAPHY BASED ON WAVEFRONT SENSORS

机译:基于WAVEFRONT传感器的定量微分干涉对比度(DIC)显微照片和照相

摘要

A wavefront microscope or camera utilizes a wavefront sensor to measure the local intensity and phase gradient of the wavefront and output image maps based on the intensity and phase gradient. A wavefront sensor provides a metal film having patterned structured two dimensional (2D) apertures that convert a phase gradient of a wavefront into a measurable form onto a photodetector array. A computer is used to analyze the data by separating signals projected and recorded on the array from the different apertures, predict a center of each projection, and sum signals for each projection to display the intensity while determining a center position change/offset from the predicted center to display the phase gradient of the wavefront.
机译:波前显微镜或照相机利用波前传感器来测量波前的局部强度和相位梯度,并根据强度和相位梯度输出图像图。波前传感器提供具有图案化的结构化二维(2D)孔的金属膜,所述二维孔将波前的相位梯度转换成可测量形式到光电检测器阵列上。使用计算机来分析数据,方法是将投影并记录在阵列上的信号与不同的光圈分开,预测每个投影的中心,并对每个投影的信号求和以显示强度,同时根据预测的结果确定中心位置的变化/偏移中心以显示波前的相位梯度。

著录项

  • 公开/公告号US2009276188A1

    专利类型

  • 公开/公告日2009-11-05

    原文格式PDF

  • 申请/专利权人 XIQUAN CUI;CHANGHUEI YANG;

    申请/专利号US20090435165

  • 发明设计人 XIQUAN CUI;CHANGHUEI YANG;

    申请日2009-05-04

  • 分类号G01B9/02;H01L27/142;G06F15/00;

  • 国家 US

  • 入库时间 2022-08-21 19:33:32

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