NONDESTRUCTIVE INSPECTION APPARATUS AND NONDESTRUCTIVE INSPECTION METHOD USING GUIDED WAVE

摘要

Disclosed herein are an apparatus and a technique for quickly detecting a defective portion including wastage, which has occurred in piping having a straight piping portion or a bending zone, in the nondestructive inspection using a guided wave.;A guided wave sensor 3 included in a guided wave inspection device 4 is mounted to the outer surface of piping 1. A guided wave is propagated to an inspection area of the piping 1. If a defective portion exists, the guided wave sensor 3 receives the guided wave that has been reflected from the defective portion. As a result, the guided wave inspection device 4 can acquire receive information including receive information derived from the defect. On the other hand, receive information acquired when piping, whose kind and shape are the same as those of the piping 1, and which has no defect to be detected, is inspected by the guided wave inspection device under the same conditions as those of the inspection of the piping 1 is stored in an inspection result storage device 12 as reference receive information. An inspection-result diagnostic device 13 compares the receive information acquired when the piping 1 to be inspected has been inspected with the reference receive information, which has been stored in the inspection result storage device 12, so that significant receive information derived from the defect is extracted.