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Digital temperature detecting system and method

机译:数字温度检测系统及方法

摘要

A digital temperature detecting system for detecting a working temperature of a chip. The digital temperature detecting system includes a clock generator, for generating a first clock signal having a constant frequency; an oscillating circuit having a plurality of Not gates coupled in series, for generating a second clock signal, wherein a total number of the Not gates is an odd number; a command issuing unit connected to the clock generator, for generating a reference command signal according to the first clock signal, wherein a counting duration and a recovery duration are generated periodically in the reference command signal; and a command processing unit connected to the command issuing unit and the oscillating circuit, for generating a counting number through counting the clocks generated in the second clock signal in the counting duration and determining a working temperature according to the counting number.
机译:一种数字温度检测系统,用于检测芯片的工作温度。该数字温度检测系统包括时钟发生器,用于产生具有恒定频率的第一时钟信号。振荡电路,具有多个串联连接的非门,用于产生第二时钟信号,其中,非门的总数为奇数;指令产生单元,其连接至时脉产生器,用以根据第一时脉信号产生参考指令信号,其中在参考指令信号中周期性地产生计数时间与恢复时间。指令处理单元,连接至指令发布单元和振荡电路,用于通过计算在计数持续时间内第二时钟信号中产生的时钟并根据计数确定工作温度来产生计数。

著录项

  • 公开/公告号US7563023B2

    专利类型

  • 公开/公告日2009-07-21

    原文格式PDF

  • 申请/专利权人 HUNG-YI KUO;CHIA-HUNG SU;

    申请/专利号US20070682761

  • 发明设计人 HUNG-YI KUO;CHIA-HUNG SU;

    申请日2007-03-06

  • 分类号G01K7/00;

  • 国家 US

  • 入库时间 2022-08-21 19:31:29

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