首页> 外国专利> IMPEDANCE-ESTIMATION METHODS, MODELING METHODS, ARTICLES OF MANUFACTURE, IMPEDANCE-MODELING DEVICES, AND ESTIMATED-IMPEDANCE MONITORING SYSTEMS

IMPEDANCE-ESTIMATION METHODS, MODELING METHODS, ARTICLES OF MANUFACTURE, IMPEDANCE-MODELING DEVICES, AND ESTIMATED-IMPEDANCE MONITORING SYSTEMS

机译:阻抗估计方法,建模方法,产品,阻抗建模设备和估计阻抗监测系统

摘要

An impedance estimation method includes measuring three or more impedances of an object having a periphery using three or more probes coupled to the periphery. The three or more impedance measurements are made at a first frequency. Three or more additional impedance measurements of the object are made using the three or more probes. The three or more additional impedance measurements are made at a second frequency different from the first frequency. An impedance of the object at a point within the periphery is estimated based on the impedance measurements and the additional impedance measurements.
机译:阻抗估计方法包括使用耦合到外围的三个或更多个探针来测量具有外围的对象的三个或更多个阻抗。在第一频率下进行三个或更多个阻抗测量。使用三个或更多探针进行对象的三个或更多附加阻抗测量。在不同于第一频率的第二频率下进行三个或更多个附加阻抗测量。基于阻抗测量和附加阻抗测量来估计物体在外围内的点处的阻抗。

著录项

  • 公开/公告号US2008294358A1

    专利类型

  • 公开/公告日2008-11-27

    原文格式PDF

  • 申请/专利权人 JOHN G. RICHARDSON;

    申请/专利号US20070753214

  • 发明设计人 JOHN G. RICHARDSON;

    申请日2007-05-24

  • 分类号G01R27/16;

  • 国家 US

  • 入库时间 2022-08-21 19:31:24

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