首页>
外国专利>
Failure analysis and testing of semi-conductor devices using intelligent software on automated test equipment (ATE)
Failure analysis and testing of semi-conductor devices using intelligent software on automated test equipment (ATE)
展开▼
机译:使用自动测试设备(ATE)上的智能软件对半导体设备进行故障分析和测试
展开▼
页面导航
摘要
著录项
相似文献
摘要
The invention provides a number of related methods which improve the test and analysis of integrated circuit devices. A first method of the invention provides a method for pausing on a SCAN based test. A second method of the invention provides a method for using stimulations and responses of a known good device to increase fault coverage of patterns in a test flow. A third method of the invention provides a method to curve trace device buffers on an ATE.
展开▼