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SixSnyGe1-x-y and related alloy heterostructures based on Si, Ge and Sn

机译:Si x Sn y Ge 1-x-y 以及基于Si,Ge和Sn的相关合金异质结构

摘要

A novel method for synthesizing device-quality alloys and ordered phases in a Si—Ge—Sn system uses a UHV-CVD process and reactions of SnD4 with SiH3GeH3. Using the method, single-phase SixSnyGe1-x-y semiconductors (x≦0.25, y≦0.11) are grown on Si via Ge1-xSnx buffer layers The Ge1-xSnx buffer layers facilitate heteroepitaxial growth of the SixSnyGe1-x-y films and act as compliant templates that can conform structurally and absorb the differential strain imposed by the more rigid Si and Si—Ge—Sn materials. The SiH3GeH3 species was prepared using a new and high yield method that provided high purity semiconductor grade material.
机译:一种在Si-Ge-Sn系统中合成器件质量合金和有序相的新方法,该方法使用UHV-CVD工艺以及SnD 4 与SiH 3 GeH < Sub> 3 。使用该方法,在Si上生长单相Si x Sn y Ge 1-xy 半导体(x≤0.25,y≤0.11)通过Ge 1-x Sn x 缓冲层Ge 1-x Sn x 缓冲层有助于异质外延生长。 Si x Sn y Ge 1-xy 膜,并作为顺应性模板,可以在结构上顺应并吸收刚性更高的应变Si和Si-Ge-Sn材料。 SiH 3 GeH 3 物种是使用一种新的高产率方法制备的,该方法提供了高纯度的半导体级材料。

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