首页> 外国专利> Structure for implementation of back-illuminated CMOS or CCD imagers

Structure for implementation of back-illuminated CMOS or CCD imagers

机译:用于实现背照式CMOS或CCD成像器的结构

摘要

A structure for implementation of back-illuminated CMOS or CCD imagers. An epitaxial silicon layer is connected with a passivation layer, acting as a junction anode. The epitaxial silicon layer converts light passing through the passivation layer and collected by the imaging structure to photoelectrons. A semiconductor well is also provided, located opposite the passivation layer with respect to the epitaxial silicon layer, acting as a junction cathode. Prior to detection, light does not pass through a dielectric separating interconnection metal layers.
机译:用于实现背照式CMOS或CCD成像器的结构。外延硅层与用作结阳极的钝化层连接。外延硅层将穿过钝化层并被成像结构收集的光转换成光电子。还提供了半导体阱,其相对于外延硅层位于钝化层的对面,用作结阴极。在检测之前,光不会穿过分隔互连金属层的介电层。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号