首页> 外国专利> Writing method of charged particle beam, support apparatus of charged particle beam writing apparatus, writing data generating method and program-recorded readable recording medium

Writing method of charged particle beam, support apparatus of charged particle beam writing apparatus, writing data generating method and program-recorded readable recording medium

机译:带电粒子束的写入方法,带电粒子束写入设备的支撑装置,写入数据生成方法和程序记录的可读记录介质

摘要

A charged particle beam writing method includes inputting design pattern data, virtually dividing a writing area to be written with the design pattern data into a plurality of small areas in a mesh-like manner, calculating a pattern density in each of the plurality of small areas based on the design pattern data, calculating a resizing amount for each pattern density in a case of irradiating a charged particle beam at an isofocal dose, resizing a dimension of the design pattern data in each of the plurality of small areas, based on the resizing amount in each of the plurality of small areas, and writing a resized design pattern on a target workpiece with the isofocal dose corresponding to the pattern density which was calculated before the resizing in each of the plurality of small areas.
机译:带电粒子束写入方法包括输入设计图案数据,将要用设计图案数据写入的写入区域以网状方式虚拟地划分为多个小区域,计算多个小区域的每一个中的图案密度。基于设计图案数据,在以等焦剂量照射带电粒子束的情况下,针对每个图案密度计算尺寸调整量,并基于尺寸调整在多个小区域的每一个中调整设计图案数据的尺寸在多个小区域中的每个小区域中,在每个目标区域中调整量,并以等焦剂量在目标工件上写入调整大小的设计图形,该等焦剂量对应于在多个小区域中的每个中调整大小之前计算出的图案密度。

著录项

  • 公开/公告号US7495243B2

    专利类型

  • 公开/公告日2009-02-24

    原文格式PDF

  • 申请/专利权人 TAKASHI KAMIKUBO;

    申请/专利号US20070682494

  • 发明设计人 TAKASHI KAMIKUBO;

    申请日2007-03-06

  • 分类号G03F7/20;H01J3/14;H01J37/302;

  • 国家 US

  • 入库时间 2022-08-21 19:29:51

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