首页> 外国专利> A process applicable to an object consisting of a substrate made of ferromagnetic electrical conductive material covered with a non-ferromagnetic electrical conductive coating layer for product measurement layer conductivity times layer thickness.

A process applicable to an object consisting of a substrate made of ferromagnetic electrical conductive material covered with a non-ferromagnetic electrical conductive coating layer for product measurement layer conductivity times layer thickness.

机译:一种适用于由包括由铁磁导电材料制成的基板组成的物体的方法,该基板覆盖有用于测量产品电导率乘以层厚度的非铁磁导电涂层。

摘要

PCT No. PCT/EP96/02627 Sec. 371 Date Mar. 16, 1998 Sec. 102(e) Date Mar. 16, 1998 PCT Filed Jun. 18, 1996 PCT Pub. No. WO97/01739 PCT Pub. Date Jan. 16, 1997Method, applicable to an object consisting of a substrate made of ferromagnetic electrically conductive material covered with a layer of a non-ferromagnetic electrically conductive coating, for measuring the product of the layer conductivity times the layer thickness, consisting in placing at least one inductor producing a variable magnetic field in a space neighboring the object, in measuring, by means of a detector consisting of at least one bounded detection surface, two quantities proportional to the parts of the time derivative of the magnetic flux created in the detection surface concomitantly by the inductor and by the object, in phase and in quadrature with a reference electrical signal, in concomitantly employing two different functions of these two measurements by defining an experimental point by taking these two functions as the two input quantities of a first chart which cannot be reduced to an equivalent chart with a single input, which is independent of the conductivity of the layer and of the conductivity and the permeability of the substrate, but is dependent on the characteristics of the inductor/object/detector system and on the variable magnetic field produced by the inductor, the said chart consisting of a network of non-secant curves which each correspond to a different value of the product of the layer conductivity times the layer thickness, and in determining on the chart which of these curves passes through the point corresponding to the measurement and deducing therefrom the value of the product of the layer conductivity times the layer thickness.
机译:PCT / PCT / EP96 / 02627号371日期1998年3月16日102(e)日期1998年3月16日PCT 1996年6月18日提交PCT Pub。 PCT公开号WO97 / 01739。日期:1997年1月16日,该方法适用于由铁磁导电材料制成的基底,该基底覆盖有一层非铁磁导电涂层,用于测量层电导率乘以层厚度的乘积,包括放置至少一个感应器在一个物体附近的空间中产生可变磁场,该感应器通过由至少一个有界检测表面组成的检测器来测量两个量,该两个量与在物体中产生的磁通量的时间导数的一部分成比例。通过电感和物体与参考电信号同相和正交地检测表面,同时通过将这两个函数作为第一个输入的两个输入量来定义实验点,从而同时使用这两个测量的两个不同函数图表,不能将其简化为具有单个输入的等效图表,该图表与层的电导率以及基底的电导率和磁导率,但取决于电感器/物体/检测器系统的特性以及电感器产生的可变磁场,所述图表由非磁通网络组成曲线,分别对应于层电导率乘以层厚度的乘积的不同值,并在图表上确定这些曲线中的哪一条通过对应于测量的点并从中推导出层电导率乘以层厚度。

著录项

  • 公开/公告号BR9608666B1

    专利类型

  • 公开/公告日2008-11-18

    原文格式PDF

  • 申请/专利权人

    申请/专利号BR19969608666

  • 发明设计人 BENOIT DE HALLEUX;BRUNO DE LIMBURG STIRUM;

    申请日1996-06-18

  • 分类号G01B1;G01B;G01B7/02;G01B7/06;G01N27/72;

  • 国家 BR

  • 入库时间 2022-08-21 19:28:33

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