首页> 外国专利> APPARATUS AND METHOD FOR OBJECTIVE MEASUREMENT AND CORRECTION OF OPTICAL SYSTEMS USING WAVEFRONT ANALYSIS

APPARATUS AND METHOD FOR OBJECTIVE MEASUREMENT AND CORRECTION OF OPTICAL SYSTEMS USING WAVEFRONT ANALYSIS

机译:利用波前分析进行光学系统目标测量和校正的装置和方法

摘要

A method for enhancing vision of an eye includes a laser delivery systemhaving a laser beam for ablating corneal material from the cornea of the eye.Measurements are made to determine an optical path difference between a planewave and a wavefront emanating from the retina of the eye for a location at asurface of the cornea. An optical correction is provided to the laser deliverysystem for the location based on the optical path difference and refractiveindicesof media through which the wavefront passes. The optical correction includesdividing the optical path difference by a difference between an index ofrefractionof corneal material and an index of refraction of air. The laser beam isdirected tothe location on the surface of the cornea and corneal material ablated at thelocation in response to the optical correction to cause the wavefront toapproximate the shape of the plane wave at that location.
机译:一种增强眼睛视力的方法,包括激光传输系统具有用于从眼睛的角膜消融角膜材料的激光束。进行测量以确定平面之间的光程差从眼睛视网膜发出的波和波阵面角膜表面。对激光输出进行光学校正基于光程差和折射的定位系统指标波前通过的媒体的数量。光学校正包括用光程差除以指数之间的差折射角膜材料的折射率和空气的折射率。激光束是针对角膜和角膜材料表面消融的位置位置以响应光学校正以使波前在该位置近似平面波的形状。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号