首页> 外国专利> OPTICAL MASK FOR ALL-OPTICAL EXTENDED DEPTH-OF-FIELD FOR IMAGING SYSTEMS UNDER INCOHERENT ILLUMINATION

OPTICAL MASK FOR ALL-OPTICAL EXTENDED DEPTH-OF-FIELD FOR IMAGING SYSTEMS UNDER INCOHERENT ILLUMINATION

机译:不连续照明下成像系统全光学扩展场深的光学掩模

摘要

A mask for enhancing the depth of focus of an optical imaging system is designed by optimizing an optical property (transmittance or reflectance) of the mask relative to the intensity distribution in the system's image plane. Preferably, a desired PSF intensity is selected, a desired misfocus parameter range is selected, and the optical property is adjusted to minimize a measure of the departure of the system's PSF intensity, as computed from the mask's optical property, from the desired PSF intensity, over the entire misfocus parameter range. Most preferably, the desired PSF intensity is selected as the inverse Fourier transform of a desired OTF. Preferably, the mask is fabricated as a DOE.
机译:通过相对于系统图像平面中的强度分布优化掩模的光学特性(透射率或反射率),来设计用于增强光学成像系统的聚焦深度的掩模。优选地,选择期望的PSF强度,选择期望的失焦参数范围,并且调节光学特性以最小化从掩模的光学特性计算出的系统的PSF强度与期望的PSF强度的偏离的量度,在整个失焦参数范围内。最优选地,期望的PSF强度被选择为期望的OTF的傅立叶逆变换。优选地,将掩模制造为DOE。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号