首页>
外国专利>
SYSTEM AND METHODS FOR FUNCTIONAL TESTING OF EMBEDDED PROCESSOR-BASED SYSTEMS
SYSTEM AND METHODS FOR FUNCTIONAL TESTING OF EMBEDDED PROCESSOR-BASED SYSTEMS
展开▼
机译:基于嵌入式处理器的系统功能测试的系统和方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
Functional testing of an embedded system is performed by a test control system that implements a peripheral emulation module to interface with an externally accessible port of the embedded system. The test control system implements a test generation processor that operates to autonomously resolve abstracted component templates and embedded system description data, specific to the embedded system, to produce a corresponding specific test program. The test control system executes the test program to drive operation of the embedded processor unit to cause transfer of test data through the external interface, which is then autonomously compared to reference data derived through the execution of the test program and specific to the embedded system, whereby the comparison results reflect the correct operation of the embedded system.
展开▼