MEASUREMENT PROBE APPARATUS FOR A PROBE MICROSCOPE, MEASUREMENT CELL AND SCANNING PROBE MICROSCOPE

摘要

The invention relates to a measurement probe apparatus for a probe microscope, in particular a scanning probe microscope, having a measurement probe holder and a measurement probe which is arranged on the measurement probe holder and is designed for a probe-microscopic investigation of a sample, wherein, at the measurement probe holder, a measurement probe chamber is formed, which at least partly holds the measurement probe, is open at a face which is remote from the measurement probe holder, and is configured for holding the liquid surrounding the measurement probe. Furthermore, the invention relates to a measurement cell for holding a liquid sample for a probe microscope, a scanning probe microscope with a measurement probe apparatus and a scanning probe microscope with a measurement cell.