首页> 外国专利> MEASUREMENT OF LIGHT FROM A PREDEFINED SCATTER ANGLE FROM PARTICULATE MATTER IN A MEDIA

MEASUREMENT OF LIGHT FROM A PREDEFINED SCATTER ANGLE FROM PARTICULATE MATTER IN A MEDIA

机译:介质中特定粒子的预定散射角光的测量

摘要

A measurement system that can measure scattered light across a predetermined scatter angle is disclosed. The measurement system has a light source (10) configured to provide light along a first axis. The measurement system has a lens system (3, 4) aligned along a second axis that has a first focus near the first axis and where the second axis is different than the first axis. The measurement system has a sensor (5) located on the second axis at a second focus of the lens system (3, 4) and is configured to detect scattered light near the first focus. The measurement system has a mask (9) located on the second axis and is configured to limit the light that reaches the sensor (5) to a predetermined angle of scatter. The disclosed invention eliminates the need for multiple nephelometric measuring devices and also system verification devices in order to perform assay of the presents or absence or number of suspended particles in a media as well as verification of the systems ability to measure in compliance to required performance attributes.
机译:公开了一种可以测量跨越预定散射角的散射光的测量系统。该测量系统具有被配置为沿第一轴提供光的光源(10)。该测量系统具有沿着第二轴对准的透镜系统(3、4),该第二轴在第一轴附近具有第一焦点,并且其中第二轴不同于第一轴。该测量系统具有位于透镜系统(3、4)的第二焦点处的第二轴上的传感器(5),并且被配置为检测第一焦点附近的散射光。该测量系统具有位于第二轴上的掩模(9),并且被配置为将到达传感器(5)的光限制为预定的散射角。所公开的发明消除了对多个浊度测量设备以及系统验证设备的需要,以便执行对介质中悬浮颗粒的存在或不存在或数量的分析,以及验证系统根据所需性能属性进行测量的能力。

著录项

  • 公开/公告号EP2008078A2

    专利类型

  • 公开/公告日2008-12-31

    原文格式PDF

  • 申请/专利权人 HACH COMPANY;

    申请/专利号EP20070758599

  • 发明设计人 PALUMBO PERRY A.;

    申请日2007-03-15

  • 分类号G01N15/02;G01N21/53;G01N33/18;

  • 国家 EP

  • 入库时间 2022-08-21 19:19:27

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