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RADIOMETRIC TEMPERATURE MEASURING METHOD AND RADIOMETRIC TEMPERATURE MEASURING SYSTEM

机译:放射线温度测量方法和放射线温度测量系统

摘要

Disclosed are a radiometric temperature measuring method and a radiometric temperature measuring system (10). A thin film (2) is formed on a substrate (1). The polarized radiation luminance component emitted from the thin film (2) is measured in a range of angle ϑeic where the emissivity does not vary. From the result of the measurement of the polarized radiation luminance component, the temperature of the thin film (2) is calculated. The polarized radiation luminance component is a p-wave polarized radiation luminance component polarized by a polarizer (3), and the p-wave polarized radiation luminance component is measured by means of a radiometer (4). A pseudo-black body (5) is disposed in a position mirror-symmetrical with respect to the radiometer (4). The radiometer (4) is shielded against the background radiation. The temperature of the pseudo-black body (5) is measured, and the measured temperature is taken into consideration in the calculation of the temperature of the thin film (2).
机译:公开了一种辐射温度测量方法和辐射温度测量系统(10)。在基板(1)上形成薄膜(2)。从薄膜(2)发射的偏振辐射亮度分量是在发射率不变的角度θeic范围内测量的。根据偏振辐射亮度分量的测量结果,计算薄膜(2)的温度。偏振辐射亮度分量是由偏振器(3)偏振的p波偏振辐射亮度分量,并且借助于辐射计(4)测量p波偏振辐射亮度分量。伪黑体(5)相对于辐射计(4)镜像对称地设置。辐射计(4)屏蔽了背景辐射。测量伪黑体(5)的温度,并且在计算薄膜(2)的温度时考虑所测量的温度。

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