首页> 外国专利> A phased scan eddy current array probe and a phase scanning method which provide complete and continuous coverage of a test surface without mechanical scanning

A phased scan eddy current array probe and a phase scanning method which provide complete and continuous coverage of a test surface without mechanical scanning

机译:相控扫描涡流阵列探头和相扫描方法无需机械扫描即可完全连续覆盖测试表面

摘要

A phased scanning method and phased scan eddy current array probe suitable for in-situ eddy current inspection of a structure without mechanical scanning. Overlapping subsets of the sensor elements within the array probe are dynamically connected in series and sequentially scanned to simulate the mechanical motion of a conventional array probe along a test surface. An algorithm to effectively balance the scan data is provided which comprises obtaining a reference scan at the time of probe installation, storing the measurement data from this reference scan in a memory device located within the probe, subtracting this reference curve from the curve obtained by all subsequent measurement scans to produce an adjusted curve, and processing the resulting adjusted curve through a high pass filter. A technique for verifying sensor elements of an eddy current array probe after permanent or semi-permanent installation against a test structure is also provided.
机译:一种相扫描方法和相扫描涡流阵列探头,适用于无需机械扫描就地检查结构的涡流。阵列探针内的传感器元件的重叠子集动态串联并依次扫描,以模拟常规阵列探针沿测试表面的机械运动。提供了一种有效平衡扫描数据的算法,该算法包括在安装探头时获得参考扫描,将来自该参考扫描的测量数据存储在位于探头内的存储设备中,从所有获得的曲线中减去该参考曲线。随后的测量扫描将生成调整后的曲线,并通过高通滤波器处理所得调整后的曲线。还提供了一种在相对于测试结构进行永久或半永久安装之后验证涡流阵列探头的传感器元件的技术。

著录项

  • 公开/公告号EP2037261A1

    专利类型

  • 公开/公告日2009-03-18

    原文格式PDF

  • 申请/专利权人 OLYMPUS NDT;

    申请/专利号EP20080164090

  • 申请日2008-09-10

  • 分类号G01N27/90;

  • 国家 EP

  • 入库时间 2022-08-21 19:15:58

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