首页> 外国专利> MULTI-REFLECTING TIME-OF-FLIGHT MASS ANALYSER AND A TIME-OF-FLIGHT MASS SPECTROMETER INCLUDING THE MASS ANALYSER

MULTI-REFLECTING TIME-OF-FLIGHT MASS ANALYSER AND A TIME-OF-FLIGHT MASS SPECTROMETER INCLUDING THE MASS ANALYSER

机译:多反射飞行时间质谱分析仪和包括质谱分析仪的飞行时间质谱仪

摘要

A multi-reflecting TOF mass analyser has two parallel, gridless ion mirrors each having an elongated structure in a drift direction (Z). These ion mirrors provide a folded ion path formed by multiple reflections of ions in a flight direction (X), orthogonal to the drift direction (Z). The analyser also has a further gridless ion mirror for reflecting ions in the drift direction (Z). In operation ions are spatially separated according to mass-to-charge ratio due to their different flight times along the folded ion path and ions having substantially the same mass-to-charge ratio are subjected to energy focusing with respect to the flight and drift directions.
机译:多反射TOF质量分析仪具有两个平行的无栅格离子镜,每个离子镜在漂移方向(Z)上具有细长结构。这些离子镜提供了一个折叠离子路径,该路径由离子在垂直于漂移方向(Z)的飞行方向(X)上的多次反射形成。分析仪还具有另一个无栅离子镜,用于在漂移方向(Z)上反射离子。在操作中,由于离子在折叠离子路径上的飞行时间不同,因此它们根据质荷比在空间上分离,并且质荷比基本相同的离子会相对于飞行和漂移方向进行能量聚焦。

著录项

  • 公开/公告号EP2078305A2

    专利类型

  • 公开/公告日2009-07-15

    原文格式PDF

  • 申请/专利权人 SHIMADZU CORPORATION;

    申请/专利号EP20070830134

  • 发明设计人 SUDAKOV MICHAEL;

    申请日2007-10-12

  • 分类号H01J49/40;

  • 国家 EP

  • 入库时间 2022-08-21 19:15:18

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