APPARATUS AND METHOD OF A LOW POWER BUILT-IN SELF TEST BASED ON PROBABILITY MODELS

摘要

An apparatus and a method of a low power built-in self test based on probability models are provided to reduce average power, instant power and heat generated due to a test operation, thereby stably testing a circuit. A low power BIST(Built-In Self Test) device(1100) and a test circuit(1200) based on probability models are included in a chip. The low power BIST device based on probability models inputs a random test pattern to the test circuit. The low power BIST device based on probability models analyzes a test result corresponding to input. The random test pattern is a scan input value filled with a scan chain of the test circuit. The low power BIST device based on probability models includes a random value generation module(1110), a transition suppressing signal generating module(1120) and an input selection module(1130). The random number generation module generates a random number used for the circuit test. The transition suppressing signal generating module generates a transition suppressing signal by using the random number and a determined probability model. The input selection module determines a scan input value inputted by a scan chain according to the transition suppressing signal.