SYSTEM AND A METHOD FOR EVALUATING A LOCAL HEATING PERFORMANCE OF A MEMORY MODULE MOUNTING TESTER CAPABLE OF SHORTENING AN EVALUATION TIME

摘要

PURPOSE: A system and a method for evaluating a local heating performance of a memory module mounting tester are provided to enhance a product yield by not sacrificing a memory module manufactured for evaluation.;CONSTITUTION: A system for evaluating a local heating performance of a memory module mounting tester includes an exclusive substrate(200) for evaluation, a multi temperature measuring machine(210), and a high rank computer(220). The exclusive substrate is mounted in a socket on a main board. A temperature sensor chip(202) is mounted on the exclusive substrate. The temperature sensor chip measures temperature of a side of the exclusive substrate. The multi temperature measuring machine collects a temperature measured value transmitted from the temperature sensor chip mounted on the exclusive substrate. The high rank computer evaluates a local heating performance by using the temperature measured value transmitted from the multi temperature measuring machine, and displays the evaluated result.;COPYRIGHT KIPO 2010