首页> 外国专利> SILICON STRUCTURE DETECTOR AND A DETECTING METHOD USING A GALVANOMETER SCANNER INSPECTING LASER LIGHT IN A SILICON STRUCTURE

SILICON STRUCTURE DETECTOR AND A DETECTING METHOD USING A GALVANOMETER SCANNER INSPECTING LASER LIGHT IN A SILICON STRUCTURE

机译:硅结构检测器及利用检流计扫描仪检测硅结构中激光的方法

摘要

PURPOSE: A silicone structure detector and a detecting method using a galvanometer scanner inspecting laser light in a silicon structure are provided to simply inspect the state of a silicon structure by scanning the silicon wafer.;CONSTITUTION: A silicone structure detector and a detecting method using a galvanometer scanner inspecting laser light in a silicon structure include a light source(31), an x-axis mirror, a y-axis mirror, an x-axis galvanometer, a y-axis galvanometer and a light detector. The light source outputs the laser light. The x-axis mirror and y-axis mirror reflect the laser light. The optical detector measures the power of the laser light in which it penetrates the silicone structure.;COPYRIGHT KIPO 2010
机译:目的:提供硅结构检测器和使用检流计扫描仪检查硅结构中的激光的检测方法,以通过扫描硅片简单地检查硅结构的状态。;构成:硅结构检测器和使用检测硅结构的激光的检流计扫描仪包括光源(31),x轴镜,y轴镜,x轴检流计,y轴检流计和光检测器。光源输出激光。 x轴镜和y轴镜反射激光。光学探测器可测量激光穿透硅树脂结构的功率。; COPYRIGHT KIPO 2010

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