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Apparatus and method for measuring a particle size distribution on the basis of a light scattering method

机译:基于光散射法测量粒度分布的装置和方法

摘要

Device for measuring a particle size distribution on the basis of light scattering,– in the case of a sample (8) with from a light source (1) could be irradiated light originating is,– in the case of which the scattered light produced by a photodetector (10) can be detected and– in the case of the particle size distribution on the basis of a by the photodetector (10) detected scattered light - intensity pattern can be determined,– in the case of a tracking mechanism (22, 23, 27, 30, 31, 32, 35) is provided, by means of which an optical axis of the light source (1) and / or an optical axis of an optical device (6, 9, 26, 33, 34) between the light source (1) and the photodetector (10) with an optical axis of the photodetector (10) can be brought into coincidence,– in the case of a device for measuring a quantity of light of the sample (8) on the incident light is provided,– in the case of a device for measuring a to the photodetector (10) incident light quantity is provided, wherein the optical axes..
机译:用于测量基于光散射的粒度分布的设备,-样品(8)带有来自光源(1)的光可能会被辐照,-在这种情况下,可以检测到一个光电探测器(10),并且-在通过光电探测器(10)检测到的散射光的粒度分布情况下-可以确定强度模式;-对于跟踪机构(22,设有23、27、30、31、32、35),借助它们,光源(1)的光轴和/或光学装置(6、9、26、33、34)的光轴可以使光源(1)和光检测器(10)之间的光轴与光检测器(10)的光轴重合–在测量仪器上样品(8)的光量的装置上提供入射光; –对于测量光检测器(10)的装置,提供入射光量,其中光轴..

著录项

  • 公开/公告号DE10149917B4

    专利类型

  • 公开/公告日2009-03-05

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE2001149917

  • 发明设计人

    申请日2001-10-10

  • 分类号G01N15/02;G01N21/00;

  • 国家 DE

  • 入库时间 2022-08-21 19:09:59

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