A method for marking and visualization of an implant by means of an x-ray - phase contrast - tomography under no and an implant

摘要

The invention relates to a method for marking and visualization of an implant by means of an x-ray - phase contrast - tomography under no and an implant (20, 21, 22), and in this case it is proposed, implants (20, 21, 22) with as unique specific properties with respect to the generated by the phase shift (δφ_V1, Δφ_V2) in the case of a phase contrast - tomography under no to be used, wherein these specific properties, which is generated by the typical itself specific phase shift (δφ_V1, Δφ_V2), by means of typical differences of the specific phases displacement values or by typical spatial structures of materials with well-defined phase shift values (δφ_V1, Δφ_V2) can consist.