首页>
外国专利>
Stochastic point sample measuring method, involves detecting stochastic point sample on surface using camera, and continuing basic pattern with smaller points over larger points of other basic pattern
Stochastic point sample measuring method, involves detecting stochastic point sample on surface using camera, and continuing basic pattern with smaller points over larger points of other basic pattern
The method involves detecting a stochastic point sample on a surface using a camera, where the stochastic point sample is formed by overlapping two basic patterns (1) with different point sizes. One of the basic patterns is continued with smaller points (2) over larger points of the other basic pattern such that the smaller points are distinguishable within the larger points. Colors of the basic pattern with the smaller points are inverted within the points of the other basic pattern with the larger points, where the basic patterns are black-and-white. Independent claims are also included for the following: (1) a measuring instrument comprising a camera (2) a surface comprising a stochastic point sample.
展开▼