首页> 外国专利> Dual slit photodetector e.g. phototransistor, for use in e.g. position determination device for determining position in encoder sensor, has outer and inner photo-active surfaces provided with different length-to-width ratios

Dual slit photodetector e.g. phototransistor, for use in e.g. position determination device for determining position in encoder sensor, has outer and inner photo-active surfaces provided with different length-to-width ratios

机译:双缝光电探测器光电晶体管,用于例如用于确定编码器传感器中位置的位置确定装置,其内外光敏表面具有不同的长宽比

摘要

The photodetector (1) has outer photo-active surfaces (4, 5) provided with a small length-to-width ratio of 5, and inner photo-active surfaces (2, 3) provided with a large length-to-width ratio of 10. The inner and outer photo-active surfaces are arranged parallel to a common substrate. The outer photo-active surfaces are arranged around the inner photo-active surfaces on the common substrate. An outer movable safety screen is arranged at a large distance to the photodetector. An incident light hits an optical grid element and is diffracted in a wavelength dependent manner.
机译:光电检测器(1)具有长宽比为5的外部光敏表面(4、5)和长宽比为大的内部光敏表面(2、3)图10的内和外光敏表面平行于共同的基板布置。外光敏表面围绕公共基板上的内光敏表面布置。外部可移动安全屏幕与光电探测器相距较大。入射光入射到光栅元件上,并以波长相关的方式发生衍射。

著录项

  • 公开/公告号DE102008007681A1

    专利类型

  • 公开/公告日2009-09-10

    原文格式PDF

  • 申请/专利权人 DELIGHT UNION LIMITED;

    申请/专利号DE20081007681

  • 发明设计人 BUEHNER HANS-FRIEDRICH;

    申请日2008-02-06

  • 分类号G01J1/42;

  • 国家 DE

  • 入库时间 2022-08-21 19:09:16

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