Microcontroller, has computing unit whose address output is connected with parallel input of shift register, where series input and output of shift register are connected with connection of microcontroller and computing unit, respectively

摘要

The microcontroller (10) has test circuit (13) comprising a shift register (SR) with series input, series output, parallel input and parallel output. The test circuit comprises a multiplexer connected with a program memory (114). Output of the multiplexer is connected with a computing unit (11). Address output of the computing unit is connected with the parallel input of the shift register. The series input of the shift register is connected with a connection of the microcontroller. The series output of the shift register is connected to a connection of the computing unit. An independent claim is also included for a method for testing a micro controller in test mode.