首页> 外国专利> Arrangement for flip-chip-dry construction, has integrated switching circuit with multiple solder contact elements and support, on which integrated switching circuit is positioned

Arrangement for flip-chip-dry construction, has integrated switching circuit with multiple solder contact elements and support, on which integrated switching circuit is positioned

机译:倒装芯片干式结构的布置,具有带有多个焊锡接触元件和支撑的集成开关电路,集成开关电路位于其上

摘要

The arrangement has an integrated switching circuit with multiple solder contact elements and a support (100), on which the integrated switching circuit is positioned. The support has multiple contact points on its side that faces the integrated circuit. The contact point is aligned to an electro conductive connection with solder contact elements of the integrated switching circuit by a fusion soldering process. Independent claims are included for the following: (1) a testing arrangement for testing the position of an integrated circuit relative to a carrier of an arrangement in flip-chip-dry construction; and (2) a method for testing the position of an integrated circuit relative to a carrier of an arrangement in flip-chip-dry construction.
机译:该装置具有集成开关电路,该集成开关电路具有多个焊料接触元件和支架(100),集成开关电路位于支架(100)上。支撑件在其面对集成电路的一侧具有多个接触点。接触点通过熔融焊接工艺与集成开关电路的焊料接触元件对准导电连接。以下内容包括独立权利要求:(1)一种测试装置,用于测试集成电路相对于倒装干式构造的装置的载体的位置; (2)一种用于测试集成电路相对于倒装干式构造中的装置的载体的位置的方法。

著录项

  • 公开/公告号DE102008014742A1

    专利类型

  • 公开/公告日2009-09-24

    原文格式PDF

  • 申请/专利权人 QIMONDA AG;

    申请/专利号DE20081014742

  • 发明设计人 KAHLISCH KNUT;KELLER JOERG;REISS MARTIN;

    申请日2008-03-18

  • 分类号H05K3/32;H01L23/32;H01L23/544;

  • 国家 DE

  • 入库时间 2022-08-21 19:09:14

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