首页> 外国专利> Method for supplying quality measure for X-ray picture recording system to produce three dimensional reconstruction, involves placing caliber object in X-ray picture recording system, where multiple calibration operations are carried out

Method for supplying quality measure for X-ray picture recording system to produce three dimensional reconstruction, involves placing caliber object in X-ray picture recording system, where multiple calibration operations are carried out

机译:为x射线图像记录系统提供质量度量以产生三维重建的方法,包括将口径物体放置在x射线图像记录系统中,在该系统中进行多次校准

摘要

The method involves placing (S10) a caliber object in an X-ray picture recording system. Multiple calibration operations are carried out (S12), where an effect of position is passed through and with each calibration operation. The X-ray of the calibration object is accommodated in each position. The projection parameters are utilized from each calibration operation for calculating (S20) a size and this size is utilized as quality measure.
机译:该方法包括将口径物体放置(S10)在X射线图像记录系统中。进行多次校准操作(S12),其中通过校准影响并伴随每次校准操作传递位置的影响。校准对象的X射线位于每个位置。从每个校准操作利用投影参数来计算尺寸(S20),并且将该尺寸用作质量度量。

著录项

  • 公开/公告号DE102008018924A1

    专利类型

  • 公开/公告日2009-10-29

    原文格式PDF

  • 申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;

    申请/专利号DE20081018924

  • 发明设计人 HEIGL BENNO;VOGT FLORIAN;

    申请日2008-04-15

  • 分类号G01N23/06;G01N23/04;

  • 国家 DE

  • 入库时间 2022-08-21 19:09:10

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