首页> 外国专利> Method of conditioning resistive memory cells of memory array, involves applying pulse to unreliable cell such that pulse shifts resistance respectively associated with unreliable cell to predetermined reliable resistance range

Method of conditioning resistive memory cells of memory array, involves applying pulse to unreliable cell such that pulse shifts resistance respectively associated with unreliable cell to predetermined reliable resistance range

机译:调节存储器阵列的电阻性存储单元的方法,包括将脉冲施加到不可靠的单元,使得脉冲将分别与不可靠的单元相关联的电阻移位到预定的可靠电阻范围

摘要

The group of resistive memory cells (102) is accessed. A pulse is applied to unreliable cell such that the pulse shifts the resistance respectively associated with unreliable cell to a predetermined reliable resistance range.
机译:电阻存储单元组(102)被访问。向不可靠的电池施加脉冲,使得该脉冲将分别与不可靠的电池相关联的电阻移位到预定的可靠电阻范围。

著录项

  • 公开/公告号DE102008030859A1

    专利类型

  • 公开/公告日2009-01-29

    原文格式PDF

  • 申请/专利权人 QIMONDA AG;

    申请/专利号DE20081030859

  • 申请日2008-06-30

  • 分类号G11C13/00;G11C13/02;

  • 国家 DE

  • 入库时间 2022-08-21 19:09:09

相似文献

  • 专利
  • 外文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号