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Method for determining the local emission profile of suprathermal electrons
Method for determining the local emission profile of suprathermal electrons
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机译:确定超热电子局部发射曲线的方法
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摘要
The invention concerns a process for determining a local emissivity profile of suprathermal electrons coming from an ionized gas ring placed in a toric vessel, with the use of tomographic inversion by means of Bessel functions Jo of order 0 which exploits line-integrated measurements acquired by current real-time Hard-X-Ray diagnostics.
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