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A device for measuring and controlling the thickness of different components of flat, translucent and multilayer products

机译:一种用于测量和控制扁平,半透明和多层产品不同组件厚度的设备

摘要

A device for measuring and controlling the thickness of different components in flat and translucent products Multilayer Consisting of supportsFor receiving light source, such as laser, measurement windowKeep the device on the product to be controlled by allowing the beam to pass throughAllow the reading board to slideAnd a ladderSuitable for the geometry of the device and the refractive index of the material for direct reading measures The device of the invention is suitable for measuring and controlling the glass and gas blade thickness of the conventional double glass window of the building by using a commercial laser.
机译:用于测量和控制平面和半透明产品中不同组件厚度的设备多层包含支撑件用于接收激光,测量窗口等光源通过使光束穿过使设备保持在要控制的产品上允许阅读板滑动和适用于设备的几何形状和材料的折射率的梯子,用于直接读取测量值本发明的设备适用于通过使用商业激光来测量和控制建筑物的传统双层玻璃窗的玻璃和气刀厚度。

著录项

  • 公开/公告号FR2918170A3

    专利类型

  • 公开/公告日2009-01-02

    原文格式PDF

  • 申请/专利权人 CHRISTOPHE MARC HADRI;

    申请/专利号FR0704776A

  • 发明设计人 CHRISTOPHE MARC HADRI;

    申请日2007-06-29

  • 分类号G01B11/06;

  • 国家 FR

  • 入库时间 2022-08-21 19:07:24

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