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Electronic analysis circuit for e.g. projected capacitive sensor of electronic multi-contacts passive matrix tactile device, has detection unit detecting characteristics, where scanning characteristic is temporarily or locally modulated
Electronic analysis circuit for e.g. projected capacitive sensor of electronic multi-contacts passive matrix tactile device, has detection unit detecting characteristics, where scanning characteristic is temporarily or locally modulated
The circuit has an electrical power supply unit for supplying power to one of axes of a matrix of a multi-contacts passive matrix tactile sensor (1). A detection unit detects electric characteristics such as voltage, resistance and capacitance, along the other axis of the matrix, at nodes between the axes, where scanning characteristic is temporarily or locally modulated by temporarily or locally modifying scanning frequency and scanning resolution.
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