首页> 外国专利> MEASURING METHOD OF ION CONCENTRATION CHANGE LAYER, MEASURING DEVICE OF ION CONCENTRATION CHANGE LAYER, AND JOINING METHOD

MEASURING METHOD OF ION CONCENTRATION CHANGE LAYER, MEASURING DEVICE OF ION CONCENTRATION CHANGE LAYER, AND JOINING METHOD

机译:离子浓度变化层的测定方法,离子浓度变化层的测定装置及接合方法

摘要

PROBLEM TO BE SOLVED: To provide a measurement method of an ion concentration change layer capable of measuring the thickness of the ion concentration change layer even if the ion concentration change layer is thin in thickness.;SOLUTION: A conjugant formed by joining a body to be joined and glass containing an ion is treated, and an observation face composed a face crossing wit the joining face of the body to be joined and the glass is formed. Next, a reflection electronic image of the observation face is generated (S10), and by adjusting that contrast of the reflection electronic image, the boundary line of the ion concentration change layer formed on a part facing the joining face on the glass is visualized on the reflection electron image (S20).;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种即使离子浓度变化层的厚度薄也能够测量离子浓度变化层的厚度的离子浓度变化层的测量方法。被接合的物体被处理,并且包含离子的玻璃被处理,并且观察表面构成了与被接合物体的接合表面相交的表面,并且形成了玻璃。接下来,生成观察面的反射电子图像(S10),并且通过调节反射电子图像的对比度,在玻璃上的面对接合面的部分上形成的离子浓度变化层的边界线被可视化。反射电子图像(S20).;版权所有:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010055898A

    专利类型

  • 公开/公告日2010-03-11

    原文格式PDF

  • 申请/专利权人 FUJI ELECTRIC HOLDINGS CO LTD;

    申请/专利号JP20080218705

  • 发明设计人 TACHIMACHI KANJI;

    申请日2008-08-27

  • 分类号H01J37/22;H01L21/02;C03C27/00;

  • 国家 JP

  • 入库时间 2022-08-21 19:05:31

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