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NOISE TESTING SYSTEM AND NOISE TESTING METHOD

机译:噪声测试系统及噪声测试方法

摘要

PROBLEM TO BE SOLVED: To superimpose differential noise for test on a differential signal, with high accuracy.;SOLUTION: Noise generated by a noise generator 10 is distributed to a positive side delay circuit 31 and a negative side delay circuit 32 by a divider 20. Noises output by the positive side delay circuit 31 and the negative side delay circuit 32 are applied to respective signal lines, on the positive side and the negative side, constituting a differential transmission path via a coupling capacitor and a resistance. The resistance value of the resistor is set fully higher than a characteristic impedances of the respective signal lines on the positive side and on the negative side. Respective delay amounts of the positive side delay circuit 31 and the negative side delay circuit 32 are set so that they have delay differences from each other determined by a frequency of the noise generated by the noise generator 10 and amplitude of the differential noise to be applied to the differential transmission path through the respective resistances.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:以高精度将差分噪声叠加在差分信号上进行测试;解决方案:噪声发生器10产生的噪声通过除法器20分配到正侧延迟电路31和负侧延迟电路32由正侧延迟电路31和负侧延迟电路32输出的噪声经由耦合电容器和电阻被施加到构成差分传输路径的正侧和负侧的各个信号线上。电阻器的电阻值被设置为完全高于正极侧和负极侧的各个信号线的特性阻抗。设置正侧延迟电路31和负侧延迟电路32的各自的延迟量,使得它们彼此具有由噪声产生器10产生的噪声的频率和要施加的差分噪声的幅度确定的延迟差。通过各自的电阻连接到差分传输路径。版权所有:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010135891A

    专利类型

  • 公开/公告日2010-06-17

    原文格式PDF

  • 申请/专利权人 FUJITSU MICROELECTRONICS LTD;

    申请/专利号JP20080307347

  • 发明设计人 SUZUKI MASAAKI;

    申请日2008-12-02

  • 分类号H04L25/02;H04B3/50;

  • 国家 JP

  • 入库时间 2022-08-21 19:05:22

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