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OPTICAL HETERODYNE SPECTRUM ANALYZER

机译:光学杂散光谱分析仪

摘要

PROBLEM TO BE SOLVED: To perform determination of wavelength and power values of a spectrum and their calibration such as correction with a simple configuration.;SOLUTION: A wave length detection part 200 detects a predetermined wavelength interval and transmits transmission light corresponding to a spectrum wavelength interval by allowing an etalon 11 to receive swept light output from a variable-wavelength light source and transmit the light at the predetermined wavelength interval. A measuring part 100 calibrates a spectrum detected by the wavelength detection parton the basis of the wavelengths of light to be measured whose powers have been measured. Moreover, based on each peak power corresponding to the predetermined wavelength interval output from the wavelength detection part, a correction part 10 corrects the power of the spectrum measured by the measuring part.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:以简单的配置来执行光谱的波长和功率值的确定及其校正等校准;解决方案:波长检测部200检测预定的波长间隔并透射与光谱波长相对应的透射光通过允许标准具11接收从可变波长光源输出的扫掠光并以预定波长间隔透射光来使间隔减小。测量部件100基于功率已经被测量的被测量光的波长来校准由波长检测部件检测到的光谱。此外,校正部分10基于与从波长检测部分输出的预定波长间隔相对应的每个峰值功率,校正由测量部分测量的光谱的功率。COPYRIGHT:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010210491A

    专利类型

  • 公开/公告日2010-09-24

    原文格式PDF

  • 申请/专利权人 ANRITSU CORP;

    申请/专利号JP20090057994

  • 发明设计人 SAITO TAKANORI;

    申请日2009-03-11

  • 分类号G01J3/02;G01J3/26;G01J9/02;

  • 国家 JP

  • 入库时间 2022-08-21 19:04:58

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