首页> 外国专利> METHOD FOR MEASURING THICKNESS OF ADHESIVE LAYER IN CEMENTED BODY, CEMENTED LENS, AND CEMENTED BODY

METHOD FOR MEASURING THICKNESS OF ADHESIVE LAYER IN CEMENTED BODY, CEMENTED LENS, AND CEMENTED BODY

机译:胶结体,胶结物和胶结体中胶粘层厚度的测量方法

摘要

PROBLEM TO BE SOLVED: To provide a method for measuring the thickness of an adhesive layer in a cemented body, which properly measures the thickness of an adhesive layer regardless of the magnitude of a difference in refractive index of elements in a cemented body.;SOLUTION: The method for measuring the thickness of an adhesive layer of a cemented body having a first layer and an adhesive layer having nearly the same refractive index as the first layer and welded to the first layer, has: a reflective layer formation process S10 for forming, on the interface between the first layer and the adhesive layer, a reflective layer having higher reflectivity than the interface; a measuring light application process S20 for applying measuring light onto the reflective layer; a reflected light acquisition process S30 for acquiring the reflected light of the measuring light reflected by the reflective layer; and a reflected light analysis process S40 for calculating the thickness of the adhesive layer on the basis of the obtained reflected light.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:提供一种用于测量粘合体中粘合剂层的厚度的方法,该方法可以适当地测量粘合层的厚度,而与粘合体中元素的折射率差异的大小无关。 :测量具有第一层和与第一层具有几乎相同的折射率并焊接到第一层的粘合层的粘合体的粘合层的厚度的方法,具有:反射层形成过程S10,用于形成在第一层和粘合层之间的界面上,具有比界面更高的反射率的反射层;测量光施加过程S20,用于将测量光施加到反射层上;反射光获取过程S30,用于获取反射层反射的测量光的反射光。 COPYRIGHT:(C)2011,JPO&INPIT;以及反射光分析过程S40,用于基于获得的反射光计算粘合剂层的厚度。

著录项

  • 公开/公告号JP2010249600A

    专利类型

  • 公开/公告日2010-11-04

    原文格式PDF

  • 申请/专利权人 OLYMPUS CORP;

    申请/专利号JP20090098000

  • 发明设计人 SUZUKI HIROO;

    申请日2009-04-14

  • 分类号G01B11/06;

  • 国家 JP

  • 入库时间 2022-08-21 19:03:53

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号