Test pattern analytical device and method of test pattern formation device and method and data of data, and disk medium for data retention and/or test equipment of record reproducing head and method

摘要

Test pattern analytical method and the device of test pattern formation method and the device and the data of the data, and disk medium for data retention and/or method of exam and the device of the record reproducing head are disclosed. Regarding desirable form, for testing disk medium for data retention is written test pattern formation method of the data which is disclosed to (4). Particular method, the process which it turns, the process which the disk (4) detects the fluctuation of rotary speed, in order the disk (4) to make align with revolution, following the disk (4) to particular fluctuation, test pattern of the data (58) the process which is made to form, has the reference clock pulse (53) process, and the particular reference clock pulse which are made to form (53) as timing reference using. Selective figure Figure 1