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METHOD FOR MEASURING PHASE TRANSITION CONDITIONS OF SAMPLE TO BE SUBJECTED TO PHASE TRANSITION, AND MEASURING APPARATUS THEREFOR

机译:一种测量样品在相变条件下的相变条件的方法及其装置

摘要

PROBLEM TO BE SOLVED: To provide a method for measuring phase transition conditions such as a phase transition temperature and a measuring apparatus therefor, by which a measurement can be carried out with a sample having a thickness of around 1 μm and a size of around 1 mm, and even with a plurality of samples simultaneously.;SOLUTION: A method for measuring phase transition conditions of a sample to be subjected to phase transition is characterized in that an electromagnetic change of the sample to be subjected to phase transition is measured as at least one of emissivity, reflectance, and transmittance under such conditions as generating phase transition, and that phase transition conditions of the sample to be subjected to phase transition are measured with change in emissivity, reflectance, and transmittance of the sample.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种用于测量诸如相变温度的相变条件的方法及其测量装置,通过该方法可以对厚度约为1μm且尺寸为1μm的样品进行测量。解决方案:一种用于测量要进行相变的样品的相变条件的方法,其特征在于,测量要进行相变的样品的电磁变化作为在发生相变的条件下的发射率,反射率和透射率中的至少一项,并且随着样品的发射率,反射率和透射率的变化来测量要进行相变的样品的相变条件。 :(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010048618A

    专利类型

  • 公开/公告日2010-03-04

    原文格式PDF

  • 申请/专利权人 TOKYO INSTITUTE OF TECHNOLOGY;

    申请/专利号JP20080211974

  • 发明设计人 HATA SEIICHI;SAKURAI JUNPEI;AONO YUKO;

    申请日2008-08-20

  • 分类号G01N25/04;G01N21/17;G01J5/48;

  • 国家 JP

  • 入库时间 2022-08-21 19:01:20

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