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The temperature detection means which detect the temperature of the electronic device where the life

机译:温度检测装置,用于检测使用寿命长短的电子设备的温度

摘要

PROBLEM TO BE SOLVED: To make it possible to notify a user of an accurate lifetime of a semiconductor laser.;SOLUTION: A temperature detection means 2 detects temperature of an electronic device 1 of which the lifetime is dependent on temperature. A measuring means 4 measures operation time of the electronic device 1. A storage means 5 stores a deriving means for deriving a weighting coefficient according to a deviation from an average temperature corresponding to an actual use environment from the temperatures at the time of operating the electronic device 1. Using the deriving means 20, a accumulation means 20 derives the weighting coefficient from the temperature of the electronic device 1 detected by the temperature detection means 2, corrects operation time using the derived weighting coefficient, accumulates the corrected operation time. A display means 6 displays the accumulated operation time.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:为了能够通知用户半导体激光器的准确寿命。解决方案:温度检测装置2检测寿命取决于温度的电子设备1的温度。测量装置4测量电子设备1的操作时间。存储装置5存储用于根据与实际使用环境相对应的平均温度与操作电子装置时的温度的偏差来导出加权系数的导出装置。累加装置20使用导出装置20从由温度检测装置2检测到的电子设备1的温度导出加权系数,使用导出的加权系数校正操作时间,累积校正后的操作时间。显示装置6显示累积的操作时间。版权:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP4507634B2

    专利类型

  • 公开/公告日2010-07-21

    原文格式PDF

  • 申请/专利权人 ソニー株式会社;

    申请/专利号JP20040048269

  • 发明设计人 山堀 俊彦;

    申请日2004-02-24

  • 分类号G11B33/10;G11B7/125;

  • 国家 JP

  • 入库时间 2022-08-21 19:00:35

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