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Laser measurement method, laser state detection device, and laser state detection system

机译:激光测量方法,激光状态检测装置及激光状态检测系统

摘要

PPROBLEM TO BE SOLVED: To provide laser condition detection equipment capable of detecting highly reliably a condition using a self-coupling effect of a semiconductor laser element. PSOLUTION: This laser condition detection equipment for analyzing an irradiation beam superposed with an interference signal generated by the self-coupling effect in the semiconductor laser element to detect a condition up to a measuring object, using the semiconductor laser element for emitting a wavelength-modulated laser beam toward the measuring object, and for introducing the laser beam reflected by the measuring object, is provided, in particular, with a condition detecting photoreceiver provided to receive only the irradiation beam emitted from the laser element, and an object detecting photoreceiver provided to receive only the reflected beam by the object. PCOPYRIGHT: (C)2007,JPO&INPIT
机译:

要解决的问题:提供一种激光状态检测设备,该设备能够利用半导体激光元件的自耦合效应高度可靠地检测状态。

解决方案:该激光状态检测设备用于分析照射光束,该照射光束与半导体激光器元件中由于自耦合效应产生的干涉信号叠加在一起,以检测直至测量对象的状况,并使用半导体激光器元件发射波长调制的激光束朝向测量对象,并用于引入被测量对象反射的激光束,特别地,提供有状态检测光接收器,该状态检测光接收器设置为仅接收从激光元件发射的照射束,并进行对象检测。提供的光接收器仅接收物体反射的光束。

版权:(C)2007,日本特许厅&INPIT

著录项

  • 公开/公告号JP4432084B2

    专利类型

  • 公开/公告日2010-03-17

    原文格式PDF

  • 申请/专利权人 株式会社山武;

    申请/专利号JP20050301727

  • 发明设计人 中島 裕一;上野 達也;

    申请日2005-10-17

  • 分类号G01V8/12;H01S3;G01S17/32;G01B11;

  • 国家 JP

  • 入库时间 2022-08-21 18:59:44

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