首页> 外国专利> Echelle spectrometer assembly and method for wavelength calibration of the meter

Echelle spectrometer assembly and method for wavelength calibration of the meter

机译:埃歇尔光谱仪组件和仪器波长校准方法

摘要

Spectrometer assembly (10) includes a light source with a continuous spectrum (11), a pre-monochromator for generating a spectrum with a small linear dispersion relatively spectral portion can be selected, the spectrum of the spectral portions such The central wavelength of the spectral interval of equal or smaller than the bandwidth of the spectral range order such in the echelle spectrum, is selected, the maximum blaze efficiency, bandwidth, echelle spectrometer having means for wavelength calibration ( spatial resolution optical detector at the outlet side of the spectrum for the detection of wavelength spectra intermediate slit assembly with an inlet slit pre-monochromator (2) (21), an intermediate slit (3) and (50) 4), (5) at it can be measured. This assembly, to a reference position the light of a light source with a continuous spectrum on the detector, and wider than the monochromatic image of the entrance slit width intermediate slit (3) is generated by the pre-monochromator at the location of the intermediate slit means for calibrating the pre-monochromator is to be calibrated is provided.
机译:光谱仪组件(10)包括具有连续光谱的光源(11),用于产生线性色散较小的光谱的预单色仪,可以选择相对光谱部分,光谱部分的光谱例如是光谱的中心波长选择等于或小于光谱范围阶次的带宽(例如在echelle光谱中)的间隔,最大火焰效率,带宽,具有波长校准装置的echelle光谱仪(光谱出口处的空间分辨率光学检测器用于可以测量带有入口狭缝单色器(2)(21),中间狭缝(3)和(50)4),(5)的中间狭缝组件的波长光谱。该组件在检测器上将具有连续光谱的光源的光到参考位置,并且比中间狭缝(3)的入口狭缝宽度宽的单色图像宽,由预单色器在中间位置产生提供了用于校准将要校准的单色仪的狭缝装置。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号